Novel image sensor device

ABSTRACT

A semiconductor device includes: a photodiode formed in a substrate; and at least one transistor having a gate feature that comprises a first portion and a second portion coupled to an end of the first portion, the first portion disposed above and extending along a major surface of the substrate and the second portion extending from the major surface of the substrate into the substrate, wherein the photodiode and the at least one transistor at least partially form a pixel.

CROSS-REFERENCE TO RELATED APPLICATION

This application is a continuation of U.S. patent application Ser. No.17/020,454, filed Sep. 14, 2020, which is a continuation application ofU.S. patent application Ser. No. 15/882,894, filed Jan. 29, 2018, nowU.S. Pat. No. 10,777,591, which claims priority to U.S. ProvisionalPatent Application No. 62/545,677, filed on Aug. 15, 2017, each of whichare incorporated by reference herein in their entireties.

BACKGROUND

Integrated circuit (IC) technologies are constantly being improved. Suchimprovements frequently involve scaling down device geometries toachieve lower fabrication cost, a higher device integration density, ahigher speed, and better performance. Along with various advantagesresulting from such a reducing geometry size, improvements are beingmade directly to IC devices, for example, an image sensor device.

Generally, an image sensor device includes an array (or grid) of pixelsfor detecting incident light and recording intensity (or brightness) ofthe incident light. Each pixel includes at least one photosensitivediode (hereinafter “photodiode”) configured to detect the incident lightand convert the detected incident light into an electrical signal (e.g.,a photocurrent/current signal), and a plurality of transistors(hereinafter “pixel transistors”) coupled to the photodiode that arecollectively configured to process the electric signal(s) so as torecord the intensity or brightness of the detected incident light.

To assess performance of the image sensor device, variouscharacteristics of the image sensor device are generally considered, animportant one of which is a quantum efficiency of the image sensordevice. Such a quantum efficiency is typically determined by a “fillfactor” of the image sensor device. The fill factor is calculated as aratio of a chip area occupied by the photodiode(s) divided by a totalchip area of the respective pixel. In conventional image sensor devices,however, at least one of the above-mentioned pixel transistors areplanarly formed. That is, a respective gate feature of the at least onepixel transistor only laterally extends along a major surface of thepixel. When forming the gate feature in such a completely lateralfashion, the fill factor may be disadvantageously reduced since over agiven chip area, a chip area available for disposing the photodiodes maybe significantly reduced.

Thus, existing image sensor devices and methods to make the same are notentirely satisfactory.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the followingdetailed description when read with the accompanying figures. It isnoted that various features are not necessarily drawn to scale. In fact,the dimensions and geometries of the various features may be arbitrarilyincreased or reduced for clarity of discussion.

FIG. 1 illustrates a flow chart of an exemplary method for forming asemiconductor device, in accordance with some embodiments.

FIGS. 2A, 2B, 2C, 2D, 2E, 2F, 2G, 2H, 2I, and 2J illustratecross-sectional views of an exemplary semiconductor device duringvarious fabrication stages, made by the method of FIG. 1 , in accordancewith some embodiments.

FIG. 3 illustrates an exemplary top view of an exemplary semiconductordevice made by the method of FIG. 1 , in accordance with someembodiments.

DETAILED DESCRIPTION OF EXEMPLARY EMBODIMENTS

The following disclosure describes various exemplary embodiments forimplementing different features of the subject matter. Specific examplesof components and arrangements are described below to simplify thepresent disclosure. These are, of course, merely examples and are notintended to be limiting. For example, the formation of a first featureover or on a second feature in the description that follows may includeembodiments in which the first and second features are formed in directcontact, and may also include embodiments in which additional featuresmay be formed between the first and second features, such that the firstand second features may not be in direct contact. In addition, thepresent disclosure may repeat reference numerals and/or letters in thevarious examples. This repetition is for the purpose of simplicity andclarity and does not in itself dictate a relationship between thevarious embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath,” “below,” “lower,”“above,” “upper” and the like, may be used herein for ease ofdescription to describe one element or feature's relationship to anotherelement(s) or feature(s) as illustrated in the figures. The spatiallyrelative terms are intended to encompass different orientations of thedevice in use or operation in addition to the orientation depicted inthe figures. The apparatus may be otherwise oriented (rotated 90 degreesor at other orientations) and the spatially relative descriptors usedherein may likewise be interpreted accordingly.

The present disclosure provides various embodiments of an image sensordevice and methods to form the same. In some embodiments, the disclosedimage sensor device includes a plurality of pixels formed on asemiconductor substrate, each of which includes at least one photodiodeformed in the semiconductor substrate and at least one pixel transistorthat has a respective gate feature, at least partially, extending intothe semiconductor substrate. By forming at least one pixel transistor ineach of the plurality of pixels in such a fashion, a corresponding fillfactor of the disclosed image sensor device may be significantlyincreased since a lateral distance by which the pixel transistor extendsmay be reduced, which allows more photodiodes to be disposed over agiven chip area. As such, performance (e.g., the quantum efficiency) ofthe disclosed image sensor device can be significantly improved over theexiting image sensor devices while remaining the area where thedisclosed image sensor device is formed unchanged.

FIG. 1 illustrates a flowchart of a method 100 to form a semiconductordevice according to one or more embodiments of the present disclosure.It is noted that the method 100 is merely an example, and is notintended to limit the present disclosure. In some embodiments, thesemiconductor device is, at least part of, an image sensor device. Asemployed by the present disclosure, the image sensor device refers toany device that can detect an optical signal (e.g., photons), convert itinto an electrical signal, and process the electrical signal. Forexample, the image sensor device may be a complementarymetal-oxide-semiconductor (CMOS) image sensor (CIS) device, an activepixel sensor device, a charge coupled device (CCD), or a passive pixelsensor device. It is noted that the method 100 of FIG. 1 does notproduce a completed image sensor device. A completed image sensor devicemay be fabricated using complementary metal-oxide-semiconductor (CMOS)technology processing. Accordingly, it is understood that additionaloperations may be provided before, during, and after the method 100 ofFIG. 1 , and that some other operations may only be briefly describedherein.

In some embodiments, the method 100 starts with operation 102 in which asubstrate is provided. In some embodiments, the substrate isintrinsically or extrinsically doped with a first doping type (e.g.,p-type). The method 100 continues to operation 104 in which a recessedregion is formed over the substrate. In some embodiments, the recessedregion, formed as a ring-like structure, extends into the substrate fromits front surface. The method 100 continues to operation 106 in which anisolation dielectric material is deposited over the substrate. In someembodiments, the isolation dielectric material overlays the frontsurface of the substrate, and, accordingly, fills the recessed region.The method 100 continues to operation 108 in which an isolation featureis formed. In some embodiments, the isolation feature is formed byperforming a polishing process (e.g., a chemical mechanical polishing(CMP) process) on the isolation dielectric material until the frontsurface of the substrate is re-exposed. As such, the isolation featuremay follow the profile of the recessed region (e.g., the ring-likestructure). In other words, the isolation feature defines (e.g.,surrounds) an active region where at least a pixel is to be formed. Themethod 100 continues to operation 110 in which a first semiconductorregion is formed over the substrate. In some embodiments, the firstsemiconductor region is doped a second doping type opposite to the firstdoing type (e.g., n-type). And, the first semiconductor region islaterally surrounded by the isolation feature (i.e., within theabove-mentioned active region) and inwardly extends into the substratewith a first depth. The method 100 continues to operation 112 in which asecond semiconductor region is formed over the first semiconductorregion. In some embodiments, the second is doped the first doping type(e.g., p-type). And, the second semiconductor region inwardly extendsinto the substrate (or the first semiconductor region) with a seconddepth that is shallower than the first depth. As such, a junction incommunication with two different doping types (two different conductivetypes) may be formed in the substrate and surrounded by the isolationfeature.

Next, the method 100 continues to operation 114 in which at least aportion of the isolation feature is recessed. In some embodiments, afterthe at least a portion of the isolation feature is recessed, part of therecessed region (formed in operation 104), which was filled by theisolation dielectric material, may be re-exposed. The method 100continues to operation 116 in which a gate dielectric layer is formed.In some embodiments, the gate dielectric layer is formed over the frontsurface of the substrate, which accordingly lines the recessed portionof the isolation feature. The method 100 continues to operation 118 inwhich a gate material is formed over the gate dielectric layer. Such agate material may include a polysilicon material, for example. In someembodiments, since the gate material layer (formed in operation 116) issubstantially thin, a “trench” may be still present subsequently to theformation of the gate dielectric layer. As such, the gate material,which is typically formed as a relatively thick layer, may refill thetrench and overlay the front surface of the substrate. Alternativelystated, part of the gate material, lined by part of the gate materiallayer, inwardly extends into the substrate by the isolation feature,which will be discussed in further detail below. The method 100continues to operation 120 in which a gate stack is formed over thesubstrate. In some embodiments, the gate stack includes patterned gatedielectric layer and gate material that extends into the substrate andprotrudes from the front surface of the substrate.

In some embodiments, operations of the method 100 may be associated withcross-sectional views of a semiconductor device 200 at variousfabrication stages as shown in FIGS. 2A, 2B, 2C, 2D, 2E, 2F, 2G, 2H, 2I,and 2J, respectively. In some embodiments, the semiconductor device 200may include only one of a plurality of pixels of an image sensor device.The image sensor device 200 may be included in a microprocessor, memorycell, and/or other integrated-circuit (IC). Also, FIGS. 2A through 2Jare simplified for a better understanding of the concepts of the presentdisclosure. For example, although the figures illustrate the imagesensor device 200, it is understood the IC, in which the image sensordevice 200 is formed, may include any desired number of other devicescomprising resistors, capacitors, inductors, fuses, etc., and otherpixels that are each substantially similar to the shown pixel, which arenot shown in FIGS. 2A through 2J, for purposes of clarity ofillustration.

Corresponding to operation 102 of FIG. 1 , FIG. 2A is a cross-sectionalview of the image sensor device 200 including a substrate 202, which isprovided at one of the various stages of fabrication, according to someembodiments. As shown, the substrate 202 includes a front surface (alsoreferred to as a front side) 203, and a back surface (also referred toas a back side) 205. The substrate 202 includes a silicon substratedoped with a first doping type of dopant (e.g., a p-type dopant) such asboron, in which case the substrate 202 is a p-type substrate. In someother embodiments, the substrate 202 may include another suitablesemiconductor material. For example, the substrate 202 may be a siliconsubstrate that is doped with a different doping type of dopant (e.g., ann-type dopant) such as phosphorous or arsenic, in which case thesubstrate 202 is an n-type substrate. For purposes of consistency, thep-type dopant and n-type dopant are herein referred to as “first type ofdopant” and “second type of dopant,” respectively, in the followingdiscussions. Still in some other embodiments, the substrate 202 mayinclude other elementary semiconductors such as germanium and diamond.The substrate 202 may optionally include a compound semiconductor and/oran alloy semiconductor. Further, in some alternative embodiments, thesubstrate 202 may include an epitaxial layer (epi layer), may bestrained for performance enhancement, and may include asilicon-on-insulator (SOI) structure.

Corresponding to operation 104 of FIG. 1 , FIG. 2B is a cross-sectionalview of the image sensor device 200 including a recessed region 206,which is formed at one of the various stages of fabrication, accordingto some embodiments. As shown, the recessed region 206 is formed toextend inwardly into the substrate 202 from the front surface 203. Insome embodiments, when viewing from the top, the recessed region 206 maybe formed as a ring-like structure to surround an active region 207,wherein such an active region 207 may be used to form at least one pixelof the image sensor device 200, which may include at least onephotodiode and one pixel transistor, as will be discussed below.

In some embodiments, the recessed region 206 may be formed by performingat least some of the following processes: using chemical vapordeposition (CVD), physical vapor deposition (PVD), spin-on coating,and/or other suitable techniques to deposit one or more removable layers(e.g., a photoresist layer, a hardmask layer, etc.) over the frontsurface 203 of the substrate 202; performing one or more patterningprocesses (e.g., a lithography process, a dry/wet etching process, acleaning process, a soft/hard baking process, etc.) to form an openingthrough the one or more removable layers; using one or more (dry and/orwet) etching processes with the patterned removable layer(s) serving asa mask to recess an upper portion of the substrate 202; and removing theone or more removable layers.

Corresponding to operation 106 of FIG. 1 , FIG. 2C is a cross-sectionalview of the image sensor device 200 including an isolation dielectricmaterial 208, which is deposited at one of the various stages offabrication, according to some embodiments. As shown, the isolationdielectric material 208 is formed to overlay the front surface 203 ofsubstrate 202, and accordingly, fill the recessed region 206. In someembodiments, the isolation dielectric material 208 may include any of avariety of oxide materials such as, for example, silicon oxide. In someembodiments, the recessed region 206 is filled by the isolationdielectric material 208 using CVD, PVD, and/or other suitable depositiontechniques to overlay the front surface 203 of substrate 202.

Corresponding to operation 108 of FIG. 1 , FIG. 2D is a cross-sectionalview of the image sensor device 200 including an isolation feature 210,which is formed at one of the various stages of fabrication, accordingto some embodiments. In some embodiments, the isolation feature 210 isthe isolation dielectric material filling the recessed region 206.Accordingly, the isolation feature 210 may follow the same profile asthe recessed region 206, i.e., the ring-like structure surrounding theactive region 207. The isolation feature 210 is typically referred to asa shallow trench isolation (STI) feature. Although not shown in theillustrated embodiment of FIG. 2D (and the following figures), it isunderstood that one or more of other isolation features (e.g., a deeptrench isolation feature) may be formed around the isolation feature 210to further improve the isolation capability (e.g., reducing cross-talksbetween adjacent pixels) of the isolation feature 210 while remainingwithin the scope of the present disclosure. In some embodiments, theisolation feature 210 may be formed by performing a polishing process(e.g., a chemical mechanical polishing (CMP) process) on the isolationdielectric material (FIG. 2C) until the front surface 203 of thesubstrate 202 is re-exposed.

Corresponding to operation 110 of FIG. 1 , FIG. 2E is a cross-sectionalview of the image sensor device 200 including a first semiconductorregion 212, which is formed at one of the various stages of fabrication,according to some embodiments. As shown, the first semiconductor region212 is formed along the front surface 203 of the substrate 202 topartially overlay the substrate 202 with a portion 213 of the substrate202 exposed, and extend inwardly into the substrate 202 from the frontsurface 203 by a depth 212′. In some embodiments, the firstsemiconductor region 212 is doped with the second doping type (n-type),which is opposite to the doping type of the substrate 202. In somealternative embodiments, the first semiconductor region 212 may beformed along the front surface 203 of the substrate 202 to completelyoverlay the substrate 202 (i.e., no such an exposed portion 213 exists).

In some embodiments, the first semiconductor region 212 may be formed byat least some of the following processes: using chemical vapordeposition (CVD), physical vapor deposition (PVD), spin-on coating,and/or other suitable techniques to deposit a removable layer (e.g., aphotoresist layer, a hardmask layer, etc.) over the substrate 202;performing one or more patterning processes (e.g., a lithographyprocess, a dry/wet etching process, a cleaning process, a soft/hardbaking process, etc.) to form an opening through the removable layer,wherein the opening is surrounded by the isolation feature 210; with thepatterned removable layer serving as a mask, performing a doping process(e.g., an ion implantation process, a diffusion process, etc.) toincorporate a plurality of dopants with the second doping type (n-type)into the substrate 202; removing the removable layer; and performing anoptional annealing process to activate the incorporated dopants.

Corresponding to operation 112 of FIG. 1 , FIG. 2F is a cross-sectionalview of the image sensor device 200 including a second semiconductorregion 214, which is formed at one of the various stages of fabrication,according to some embodiments. As shown, the second semiconductor region214 is formed along the front surface 203 of the substrate 202 topartially overlay the first semiconductor region 212 with a portion 215of the first semiconductor region 212 exposed, and extend inwardly intothe first semiconductor region 212 by a depth 214′ that is shallowerthan the depth 212′ of the first semiconductor region 212.

In some embodiments, similar to the substrate 202, the secondsemiconductor region 214 is also doped with the first doping type(p-type) but in an elevated concentration. As such, a p-n junction 215may be formed at the interface between the first semiconductor region212 and the second semiconductor region 214, and in some embodiments,the first semiconductor region 212 and the second semiconductor region214 (with the p-n junction 215) may function as a photodiode of thepixel surrounded by the isolation feature 210. Employed by the presentdisclosure, such a photodiode may be configured to convert an radiationsource (e.g., light), incident from either the front surface 203 or theback surface 205, into an electrical current signal, which will bediscussed in further detail below. Further, at least partially due tothe elevated doping concentration, the second semiconductor region 214,which is typically referred to as a “pinned layer,” may be configured toprovide an isolation feature to the first semiconductor region 212,according to some embodiments.

In some embodiments, the second semiconductor region 214 may be formedby at least some of the following processes: using chemical vapordeposition (CVD), physical vapor deposition (PVD), spin-on coating,and/or other suitable techniques to deposit a removable layer (e.g., aphotoresist layer, a hardmask layer, etc.) over the substrate 202;performing one or more patterning processes (e.g., a lithographyprocess, a dry/wet etching process, a cleaning process, a soft/hardbaking process, etc.) to form an opening through the removable layer,wherein the opening is aligned with the first semiconductor region 206(e.g., laterally confined within the area defined by the firstsemiconductor region 206); with the patterned removable layer serving asa mask, performing a doping process (e.g., an ion implantation process,a diffusion process, etc.) to incorporate a plurality of dopants withthe first doping type (p-type) into the first semiconductor region 206;removing the removable layer; and performing an optional annealingprocess to activate the incorporated dopants.

Corresponding to operation 114 of FIG. 1 , FIG. 2G is a cross-sectionalview of the image sensor device 200 in which a portion of the isolationfeature 210 is recessed at one of the various stages of fabrication,according to some embodiments. As shown in the illustrated embodiment ofFIG. 2G (and the following figures), the recessed portion of theisolation feature 210 is laterally adjacent the exposed portion 213 ofthe front surface 203, which forms a trench 218 laterally adjacent theexposed portion 213 of the front surface 203. It is noted that thetrench 218 is part of the recessed region 206 (FIG. 2B). Morespecifically, in some embodiments, after the formation of the trench218, at least respective upper portions of sidewalls of the recessedregion 206 (also sidewalls 218-1 of the trench 218) and/or at least aportion of a bottom boundary of the recessed region 206 (also a bottomboundary of the trench 218) are respectively re-exposed.

In some embodiments, the trench 218 may be formed by performing at leastsome of the following processes: using chemical vapor deposition (CVD),physical vapor deposition (PVD), spin-on coating, and/or other suitabletechniques to deposit one or more removable layers (e.g., a photoresistlayer, a hardmask layer, etc.) over the front surface 203 of thesubstrate 202; performing one or more patterning processes (e.g., alithography process, a dry/wet etching process, a cleaning process, asoft/hard baking process, etc.) to form an opening through the one ormore removable layers, wherein the opening is aligned with an area wherethe trench 218 is to be formed; using one or more (dry and/or wet)etching processes with the patterned removable layer(s) serving as amask to recess a portion of the isolation feature 210; and removing theone or more removable layers.

Corresponding to operation 116 of FIG. 1 , FIG. 2H is a cross-sectionalview of the image sensor device 200 including a gate dielectric layer220, which is formed at one of the various stages of fabrication,according to some embodiments. As shown, the gate dielectric layer 220is formed to overlay the substrate 202. More specifically, the gatedielectric layer 220 overlays the isolation feature 210, the first andsecond semiconductor regions 212 and 214, the exposed portion 213 of thefront surface 203 of the substrate 202, and the trench 218. In someembodiments, since the gate dielectric layer 220 is substantially thinand conformal, the gate dielectric layer 220 may be formed to line thetrench 218, i.e., extending along the sidewalls 218-1 and the bottomboundary 218-2, while not fully filling the trench 218.

In some embodiments, the gate dielectric layer 220 is formed of a highdielectric constant (hereinafter “high-k” or “HK”) material. The high-kmaterial may include a metal oxide, a metal nitride, a metal silicate, atransition metal-oxide, a transition metal-nitride, a transitionmetal-silicate, an oxynitride of metals, a metal aluminate, a zirconiumsilicate, a zirconium aluminate, combinations thereof, or other suitablecompositions. Exemplary high-k materials further include hafnium oxide(HfO₂), hafnium silicon oxide (HfSiO), hafnium silicon oxynitride(HfSiON), hafnium tantalum oxide (HfTaO), hafnium titanium oxide(HfTiO), hafnium zirconium oxide (HfZrO), combinations thereof, and/orother suitable materials. Alternatively, the high-k materials mayinclude other high-k dielectrics such as LaO, AlO, ZrO, TiO, Ta₂O₅,Y₂O₃, SrTiO₃ (STO), BaTiO₃(BTO), BaZrO, HfLaO, HfSiO, LaSiO, AlSiO,(Ba,Sr)TiO₃ (BST), Al₂O₃, Si₃N₄, and/or other suitable materials.Although described herein as an embodiment including high-k materials,other dielectric materials (e.g., SiO₂) are possible and within thescope of the disclosure. In some embodiments, the gate dielectric layer220 may be formed by using an atomic layer deposition (ALD), CVD, or PVDtechnique to deposit at least one of the above-mentioned dielectricmaterial over the substrate 202.

Corresponding to operation 118 of FIG. 1 , FIG. 2I is a cross-sectionalview of the image sensor device 200 including a gate material 222, whichis formed at one of the various stages of fabrication, according to someembodiments. As shown, the gate material 222 overlays the substrate 202,and since the gate material 222 is formed to be substantially think, thetrench 218 is refilled with the gate material 222. According to someembodiments, the gate material 222, which includes a polysiliconmaterial, for example, may be formed by using a CVD, or PVD technique todeposit the polysilicon over the substrate 202.

Corresponding to operation 120 of FIG. 1 , FIG. 2J is a cross-sectionalview of the image sensor device 200 including a gate stack 226, which isformed at one of the various stages of fabrication, according to someembodiments. According to some embodiments, the gate stack 226 includesa patterned gate dielectric layer 220′ and a patterned gate material222′. In the illustrated embodiment of FIG. 2J, the gate stack 226includes at least two portions: a first portion 226-1 laterallyextending along the front surface 203 of the substrate 202; and a secondportion 226-2 inwardly extending into the substrate 202 from the frontsurface 203. Further, in some embodiments, the first portion 226-1laterally extends along the front surface 203 of the substrate 202 to atleast partially overlay the portion 215 of the first semiconductorregion 212.

In some embodiments, the gate stack 226 may be formed by performing atleast some of the following processes: using chemical vapor deposition(CVD), physical vapor deposition (PVD), spin-on coating, and/or othersuitable techniques to deposit one or more removable layers (e.g., aphotoresist layer, a hardmask layer, etc.) over the gate material 222;performing one or more patterning processes (e.g., a lithographyprocess, a dry/wet etching process, a cleaning process, a soft/hardbaking process, etc.) to form an opening through the one or moreremovable layers, wherein the opening is aligned with an area where thegate stack 226 is not to be formed; using one or more (dry and/or wet)etching processes with the patterned removable layer(s) serving as amask to recess respective portions of the gate material 222 and the gatedielectric layer 220; and removing the one or more removable layers.

As mentioned above, the first and second semiconductor regions 212 and214 form the photodiode of the pixel surrounded by the isolation feature210. In some embodiments, the gate stack 226 may be formed as a“transfer gate” of a transfer transistor of the pixel. In operation, thephotodiode first absorbs a radiation source, incident from either thefront surface 203 or the back surface 205, and converts the radiationsource into a plurality of electron-hole pairs in the firstsemiconductor region 212 (e.g., close to the portion 215). Then, in someembodiments, the gate stack 226 is configured to serve as a gate tocontrol (modulate) a “flow” of the generated electron-hole pairs (i.e.,an electrical current signal) into a floating diffusion region (notshown in the cross-sectional view of FIG. 2J). Such a diffusion regionis further coupled to one or more other transistors (e.g., a resettransistor, a source follower transistor, a selector transistor, etc.)of the pixel to allow the one or more other transistors to furtherprocess the generated electrical current signal.

In the conventional image sensor device, the above-described gate stackof the transfer transistor is typically formed to extend only along thefront surface 203 (i.e., no second portion 226-2). Various issues may beinduced when forming the gate stack of the transfer transistor in such acompletely lateral configuration. For example, because the gate stack ofthe transfer transistor in each of a plurality of pixels of theconventional image sensor device extends only along a single direction,the above-mentioned floating diffusion region can be only formed alongthat single direction. As such, respective pitches, across a givendistance along the direction, that are available to form the photodiodesover the plurality of pixels are significantly limited. Accordingly, an“area” available to form the photodiodes are reduced, whichdisadvantageously lowers the fill factor, in turn, deteriorating theperformance of the conventional image sensor devices.

FIG. 3 illustrates an exemplary top view 300 of the image sensor device200, in accordance with various embodiments. It is noted that thecross-sectional views shown throughs FIGS. 2A-2J are each taken alongline A-A of the top view 300. Accordingly, in addition to the first andsecond portions 226-1 and 226-2 as shown in FIG. 2J, the gate stack 226may further include a portion 226-3 laterally extended from the firstportion 226-1, and specifically, tilted from the first portion 226-1. Insome embodiments, such a tilted portion 226-3 may be disposed above thefront surface 203 (FIG. 2J), i.e., not extending into the substrate 202,which allows the photodiode (formed by the first and secondsemiconductor regions 212 and 214) to be disposed on one side 301 of thetilted portion 226-3 and the above-described floating diffusion region(305 in the illustrated embodiment of FIG. 3 ) to be disposed on anotherside 303, opposite to the side 301, of the tilted portion 226-3. Assuch, additional distances along the line A-A can be spared, which cansignificantly increase the respective pitches that are available to formthe photodiodes over the plurality of pixels of the disclosed imagesensor device 200. Thus, compared to the conventional image sensordevices, the performance of the disclosed image sensor device 200 can beadvantageously enhanced.

In an embodiment, a semiconductor device includes: a photodiode formedin a substrate; and at least one transistor having a gate feature thatat least partially extends from a major surface of the substrate intothe substrate, wherein the photodiode and the at least one transistor atleast partially form a pixel.

In another embodiment, a semiconductor device includes: a photodiodeformed in a substrate; and at least one transistor having a gate featurethat comprises a first portion and a second portion coupled to an end ofthe first portion, the first portion disposed above and extending alonga major surface of the substrate and the second portion extending fromthe major surface of the substrate into the substrate, wherein thephotodiode and the at least one transistor at least partially form apixel.

In yet another embodiment, a method includes: forming an isolationfeature extending into a substrate; forming a first semiconductor regionand a second semiconductor region in the substrate that is surrounded bythe isolation feature; recessing a portion of the isolation feature toexpose a sidewall of the isolation feature facing but laterally spacedapart from the first and second semiconductor regions; and forming agate feature that extends along a major surface of the substrate andfills the recessed portion of the isolation feature.

The foregoing outlines features of several embodiments so that thoseordinary skilled in the art may better understand the aspects of thepresent disclosure. Those skilled in the art should appreciate that theymay readily use the present disclosure as a basis for designing ormodifying other processes and structures for carrying out the samepurposes and/or achieving the same advantages of the embodimentsintroduced herein. Those skilled in the art should also realize thatsuch equivalent constructions do not depart from the spirit and scope ofthe present disclosure, and that they may make various changes,substitutions, and alterations herein without departing from the spiritand scope of the present disclosure.

What is claimed is:
 1. A semiconductor device, comprising: a photodiodeformed in a substrate; at least one transistor having a gate featurethat at least partially extends from a major surface of the substrateinto the substrate, wherein the gate feature of the at least onetransistor comprises a gate oxide layer and a polysilicon layer thateach comprises a lateral portion extending along the major surface ofthe substrate and a vertical portion extending into the substrate; and apixel comprising the photodiode and the at least one transistor.
 2. Thesemiconductor device of claim 1, wherein the substrate includes a firstsemiconductor region doped with a first concentration of a first dopanttype and a second semiconductor region disposed over the firstsemiconductor region and doped with a second concentration of the firstdopant type, the second concentration being higher than the firstconcentration.
 3. The semiconductor device of claim 2, wherein the firstdopant type comprises a p-type dopant.
 4. The semiconductor device ofclaim 2, wherein the gate feature of the at least one transistorcomprises a first portion that extends above the major surface of thesubstrate and a second portion that extends from the major surface ofthe substrate into the substrate.
 5. The semiconductor device of claim4, wherein the first portion of the gate feature of the at least onetransistor is laterally coupled to the first semiconductor region, andthe second portion of the gate feature of the at least one transistor islaterally spaced apart from the first semiconductor region.
 6. Thesemiconductor device of claim 1, further comprising an isolationfeature, extending into the substrate, that surrounds the photodiode andthe at least one transistor, wherein at least a portion of the isolationfeature directly contacts the second portion of the gate feature of theat least one transistor.
 7. The semiconductor device of claim 1, whereinthe at least one transistor is a transfer gate transistor of the pixel.8. A semiconductor device, comprising: a photodiode formed in asubstrate; at least one transistor having a gate feature that comprisesa first portion and a second portion coupled to an end of the firstportion, the first portion disposed above and extending along a majorsurface of the substrate and the second portion extending from the majorsurface of the substrate into the substrate; and an isolation feature,extending into the substrate, that surrounds the photodiode and the atleast one transistor.
 9. The semiconductor device of claim 8, whereinthe photodiode comprises: a first semiconductor region in the substratethat is doped with a first doping type; and a second semiconductorregion over the first semiconductor region that is doped with a seconddoping type.
 10. The semiconductor device of claim 9, wherein the firstand second doping types are different from each other.
 11. Thesemiconductor device of claim 9, wherein the first portion of the gatefeature of the at least one transistor is laterally coupled to the firstsemiconductor region, and the second portion of the gate feature of theat least one transistor is laterally spaced apart from the firstsemiconductor region.
 12. The semiconductor device of claim 8, whereinthe gate feature of the at least one transistor comprises a gate oxidelayer and a polysilicon layer that each comprises a lateral portionextending along the major surface of the substrate and a verticalportion extending into the substrate.
 13. The semiconductor device ofclaim 8, wherein the at least one transistor is a transfer gatetransistor of the pixel.
 14. The semiconductor device of claim 8,wherein the first portion forms an obtuse angle with the second portion.15. A semiconductor device, comprising: a photodiode formed in asubstrate, wherein the photodiode comprises a first semiconductor regionin the substrate that is doped with a first doping type, and a secondsemiconductor region over the first semiconductor region that is dopedwith a second doping type; and at least one transistor having a gatefeature that comprises a first portion and a second portion coupled toan end of the first portion, the first portion disposed above andextending along a major surface of the substrate and the second portionat least partially extending from the major surface of the substrateinto the substrate.
 16. The semiconductor device of claim 15, furthercomprising a pixel comprising the photodiode and the at least onetransistor.
 17. The semiconductor device of claim 15, further comprisingan isolation feature, extending into the substrate, that surrounds thephotodiode and the at least one transistor, wherein at least a portionof the isolation feature directly contacts the second portion of thegate feature of the at least one transistor.
 18. The semiconductordevice of claim 15, wherein: the first and second doping types aredifferent from each other; the gate feature of the at least onetransistor comprises a first portion that extends above the majorsurface of the substrate and a second portion that extends from themajor surface of the substrate into the substrate.
 19. The semiconductordevice of claim 15, wherein the first portion forms an obtuse angle withthe second portion.
 20. The semiconductor device of claim 15, wherein afirst depth of the first semiconductor region is less than a seconddepth of second semiconductor region.